Transmission electron microscopy (TEM) is a powerful imaging technique that uses a beam of electrons transmitted through an ultrathin specimen to produce highly magnified images of its internal structure.

TEM works by directing electrons through a sample that is typically less than 100 nanometers thick.

As the electrons pass through, they interact with the atoms in the material, creating contrast that reveals fine details of morphology, crystal structure, and composition.

The resulting image is magnified and projected onto a screen or detector, allowing scientists to observe features at resolutions far beyond what light microscopes can achieve.

Because electrons have much shorter wavelengths than visible light, TEM can resolve structures at the atomic scale, making it indispensable for fields like semiconductor research, nanotechnology, biology, and materials science.

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