Texas Instruments introduced a new analog-to-digital converter Monday designed to catch power faults in AI data centers at much finer time resolution than conventional monitoring systems.

The ADC34DSO75 is a quad-channel, 14-bit converter sampling at 3 gigasamples per second. TI built event detection and on-chip capture memory directly into the device, allowing it to trigger on fast voltage changes, timestamp them and save pre- and post-event samples for later analysis.

The device is part of a wider TI data-center push that also includes an 800V isolated hot-swap controller and ultra-low-jitter timing hardware. Secondary coverage says the goal is to expose transient faults that can disappear before slower telemetry systems record them.

The development connects directly to BitcoinVersus.Tech coverage of AI server power delivery, 27 kW AI rack PSUs and data-center monitoring and controls.

Editor’s Note: Performance specifications are vendor-reported and should be evaluated in production designs.